Last edited by Kazil
Thursday, July 30, 2020 | History

2 edition of An Auger electron spectroscopy study of surface-preparation contaminants found in the catalog.

An Auger electron spectroscopy study of surface-preparation contaminants

An Auger electron spectroscopy study of surface-preparation contaminants

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  • 13 Currently reading

Published by National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, For sale by the National Technical Information Service] in [Washington, DC], [Springfield, Va .
Written in English

    Subjects:
  • Auger effect.,
  • Surface contamination.

  • Edition Notes

    StatementD. Wu ... [et al.].
    SeriesNASA technical paper -- 2972.
    ContributionsWu, D., United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL15368319M

    Auger electron spectroscopy. [Michael Thompson;] based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied. Book, Internet Resource. Since the publication of the first edition, practical surface analysis has grown and diversified to such an extent that the editors have found it necessary to produce a new companion volume to cover the fields of ion and neutral spectroscopy. This first volume of the two-volume set discusses two closely related analytical techniques--Auger and X-ray photoelectron spectroscopy.

    Auger electron spectroscopy depth profiles from different surfaces of the YBa 2 Cu 3 O 7−x polycristalline compound, such as fracture and polished fracture surface of sintered ceramics, fracture of isostatically pressed powder and powder surface, have been measured. Scanning Auger Microscopy (SAM) Technique: Scanning Auger microscopy (SAM) is also known as Auger electron spectroscopy (AES). In this technique, the sample surface is bombarded with a high energy (3 – 10 kV) primary electron beam, which results in the emission of secondary, backscattered and Auger electrons from the area of bombardment and these can be readily detected and analyzed.

    This electron beam is focused typically onto a solid-state surface, exciting its immediate surrounding region with a spatial resolution of smaller than nm. The technique is very surface sensitive with an information depth of less than 5 nm, or a few atomic layers. Historical development of auger electron spectroscopy / Dale F. Stein --Studies of surface segregation kinetics by auger electron spectroscopy / Gregory Luckman --Local electron structure information in auger electron spectroscopy: solid surfaces / J.E. Houston and R.R. Rye --Metallurgical applications of auger electron spectroscopy / C.L.


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An Auger electron spectroscopy study of surface-preparation contaminants Download PDF EPUB FB2

Get this from a library. An Auger electron spectroscopy study of surface-preparation contaminants. [D Wu; United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.;]. been studied. Auger electron spectroscopy (AES) within a UHV environment has been used to de-tect the types of contaminants and the magnitudes found on the sample surfaces.

It has been found that electrochemical polishing gave the least contami-nated surface for all metals studied and that me-chanically polished surfaces were significantly cleaner. Treatise on Materials Science and Technology, Volume Auger Electron Spectroscopy examines Auger electron spectroscopy and its various uses, emphasizing both Book Edition: 1.

Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole.

Auger electron spectroscopy (AES) is a surface-sensitive technique performed in an electron beam instrument (i.e., SEM, TEM, etc.) wherein the energy of electrons emitted during relaxation of ionized atoms is used to determine the specimen composition Typical AES instrumentation employs a focused electron beam (E i = 2–5 kV) to eject a core level electron (E 1) from an atom in.

Auger electron spectroscopic analyses of the chemical changes taking place on a commonly used dispenser cathode have been carried out during activation and poisoning by several reactive gases (O 2, CO, CO 2, H 2, N 2, Ar).The chemical composition and work‐function changes on the cathode were correlated at various stages of activation and poisoning, both at room temperature and at operating.

Auger electron spectroscopy (AES) is a surface-specific analytical technique that is widely used to characterise grain boundary and interfacial segregation in structural alloys.

AES investigations are limited to those materials in which it is possible to induce in situ fracture, under high vacuum, along interfaces of interest.

Auger Electron Spectroscopy with the analyzer and provides both the sensitivity and unobstructed view needed to fully characterize microstruc-tures and nanostructures with significant sample topography.

Figure 2 shows the secondary electron images and Auger intensity maps for powder metallurgy samples obtained with the. Auger Electron Spectroscopy (AES) is a surface-specific analytical technique that utilizes a high-energy, finely focused electron beam as an excitation source.

Auger electrons are produced when the excited atoms release the extra energy to an electron that is then emitted as an Auger electron. Auger electron spectroscopy is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science.

Underlying the spectroscopic technique is the Auger effect, as it has come to be called, which is based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The Auger effect was.

AUGER ELECTRON SPECTROSCOPY STUDY OF SURFACE SEGREGATION IN COPPER-ALUMINUM ALLOYS use of LEED and Auger Electron Spectroscopy studies. The alloys were solid solutions of aluminum in copper having compositions of 1, 5, and 10 atomic percent aluminum.

cipal contaminants were carbon, oxygen, and sulfur. The samples were considered to. Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability.

subsequent deexcitation occurring by an outer-level electron de­ The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole.

Handbook of Auger Electron Spectroscopy: A Reference Book of Standard Data for Identification and Interpretation of Auger Electron Spectroscopy Data 3rd Edition by Lawrence E.

Davis (Author) ISBN ISBN Why is ISBN important. ISBN. Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces.

These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy Reviews: 1.

Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. Capability of Auger analysis to detect low concentration of contaminants element.

The purpose is to use AES in order to fix a method to detect and study the problems of die attach imputable to Ni migration. Basic Principles Auger electron spectroscopy (AES) is one of the most commonly employed surface analysis techniques.

It uses the energy of emitted electrons to identify the elements present in a sample, similar to X-ray photoelectron spectroscopy (XPS). An Auger electron spectroscopy study of surface-preparation contaminants / By D. Wu and Langley Research Center. Abstract. Prepared at Langley Research graphy: p.

of access: Internet Topics: Auger electron spectroscopy. Auger electron spectroscopy (AES) is a surface‐sensitive analytical technique that derives from the interaction of an electron beam and atoms in residence at the surface of a sample; inner shell ionizations produce Auger electrons, which have an escape depth of only a few tens of angstroms.

We report the determination of the thickness of graphene layers by Auger electron spectroscopy (AES). We measure AES spectra of graphenes with different numbers of layers. The AES spectroscopy shows distinct spectrum shape, intensity, and energy characteristics with an increasing number of graphene layers.

We also calculate electron inelastic mean free paths for graphene layers. Auger spectroscopy is an elemental analysis tool, similar to x-ray fluorescence (XRF) or energy dispersive spectroscopy (EDS). A device is bombarded with a high energy electron beam, causing the electrons orbiting the atoms of a material to become excited and.

In this paper, the authors demonstrate that Auger electron spectroscopy (AES) is an effective characterization tool in the analysis of the cleaning of semiconductor surfaces under different atmospheres. AES has several advantages for this purpose: it is nondestructive, surface specific {the analysis depth is only 4–50 Å [Childs et al., Handbook of Auger Electron Spectroscopy (Physical.Auger Electron Spectroscopy (AES, Auger) Auger Electron Spectroscopy (AES or Auger) is a surface-sensitive analytical technique that utilizes a high-energy electron beam as an excitation source.

Atoms that are excited by the electron beam can subsequently .Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied investigating the chemical and structural properties of solids.

Its ex­ plosive growth beginning in was triggered by the development of Auger analyzers capable of de­ tecting one atom layer of material in.